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  4. Standard "BS ISO 17109:2015"
WITHDRAWN BS ISO 17109:2015 31.8.2015 preview

BS ISO 17109:2015

Surface chemical analysis. Depth profiling. Method for sputter rate determination in X-ray photoelectron spectroscopy. Auger electron spectroscopy and secondary-ion mass spectrometry sputter depth profiling using single and multi-layer thin films.

Automatically translated name:

Surface chemical analysis. Depth profiling. Method for sputter rate determination in X-ray photoelectron spectroscopy, Auger electron spectroscopy and secondary-ion mass spectrometry sputter depth profiling using single and multi-layer thin films



STANDARD published on 31.8.2015


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Price304.60 USD excl. VAT
304.60 USD

The information about the standard:

Designation standards: BS ISO 17109:2015
Note: WITHDRAWN
Publication date standards: 31.8.2015
SKU: NS-612997
The number of pages: 28
Approximate weight : 84 g (0.19 lbs)
Country: British technical standard
Category: Technical standards BS

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