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Surface chemical analysis. Secondary-ion mass spectrometry. Method for depth profiling of boron in silicon.
STANDARD published on 30.9.2014
Designation standards: BS ISO 17560:2014
Publication date standards: 30.9.2014
SKU: NS-111728
The number of pages: 22
Approximate weight : 66 g (0.15 lbs)
Country: British technical standard
Category: Technical standards BS
ISBN: 978 0 580 85636 5 Status: Confirmed
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Latest update: 2026-09-09 (Number of items: 2 300 143)
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