Standard BS ISO 17560:2014 30.9.2014 preview

BS ISO 17560:2014

Surface chemical analysis. Secondary-ion mass spectrometry. Method for depth profiling of boron in silicon.



STANDARD published on 30.9.2014


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Price218.30 USD excl. VAT
218.30 USD

The information about the standard:

Designation standards: BS ISO 17560:2014
Publication date standards: 30.9.2014
SKU: NS-111728
The number of pages: 22
Approximate weight : 66 g (0.15 lbs)
Country: British technical standard
Category: Technical standards BS

The category - similar standards:

Chemical analysis

Annotation of standard text BS ISO 17560:2014 :

ISBN: 978 0 580 85636 5 Status: Confirmed

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