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Microbeam analysis. Analytical electron microscopy. Method for the determination of interface position in the cross-sectional image of the layered materials.
Translate name
STANDARD published on 4.1.2018
Designation standards: BS ISO 20263:2017
Note: WITHDRAWN
Publication date standards: 4.1.2018
SKU: NS-804643
The number of pages: 54
Approximate weight : 162 g (0.36 lbs)
Country: British technical standard
Category: Technical standards BS
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