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Surface chemical analysis. Secondary-ion mass spectrometry. Method for depth calibration for silicon using multiple delta-layer reference materials.
STANDARD published on 31.5.2009
Designation standards: BS ISO 23812:2009
Publication date standards: 31.5.2009
SKU: NS-112777
The number of pages: 30
Approximate weight : 90 g (0.20 lbs)
Country: British technical standard
Category: Technical standards BS
ISBN: 978 0 580 55765 1 Status: Confirmed
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