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  4. Standard "BS ISO 23812:2009"
Standard BS ISO 23812:2009 31.5.2009 preview

BS ISO 23812:2009

Surface chemical analysis. Secondary-ion mass spectrometry. Method for depth calibration for silicon using multiple delta-layer reference materials.



STANDARD published on 31.5.2009


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303.70 USD

The information about the standard:

Designation standards: BS ISO 23812:2009
Publication date standards: 31.5.2009
SKU: NS-112777
The number of pages: 30
Approximate weight : 90 g (0.20 lbs)
Country: British technical standard
Category: Technical standards BS

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The category - similar standards:

Chemical analysis

Annotation of standard text BS ISO 23812:2009 :

ISBN: 978 0 580 55765 1 Status: Confirmed

Latest update: 2026-09-03 (Number of items: 2 300 115)
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