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  4. Standard "BS ISO 25498:2010"
WITHDRAWN BS ISO 25498:2010 30.6.2010 preview

BS ISO 25498:2010

Microbeam analysis. Analytical electron microscopy. Selected-area electron diffraction analysis using a transmission electron microscope.



STANDARD published on 30.6.2010


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Price359.70 USD excl. VAT
359.70 USD

The information about the standard:

Designation standards: BS ISO 25498:2010
Note: WITHDRAWN
Publication date standards: 30.6.2010
SKU: NS-112965
The number of pages: 40
Approximate weight : 120 g (0.26 lbs)
Country: British technical standard
Category: Technical standards BS

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