ČSN EN IEC 63185 (353012)

Measurement of the complex permittivity for low-loss dielectric substrates balanced-type circular disk resonator method

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STANDARD published on 1.7.2021


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The information about the standard:

Designation standards: ČSN EN IEC 63185
Classification mark: 353012
Catalog number: 512226
Publication date standards: 1.7.2021
SKU: NS-1028279
The number of pages: 24
Approximate weight : 72 g (0.16 lbs)
Country: Czech technical standard
Category: Technical standards ČSN

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Annotation of standard text ČSN EN IEC 63185 (353012):

This document relates to a measurement method for complex permittivity of a dielectric substrates at microwave and millimeter-wave frequencies. This method has been developed to evaluate the dielectric properties of low-loss materials used in microwave and millimeter-wave circuits and devices. It uses higher-order modes of a balanced-type circular disk resonator and provides broadband measurements of dielectric substrates by using one resonator, where the effect of excitation holes is taken into account accurately on the basis of the mode-matching analysis. In comparison with the conventional method described in IEC 62810 and IEC 61338-1-3, this method has the following characteristics: - the values of the relative permittivity er´ and loss tangent tan d normal to dielectric plate samples can be measured accurately and non-destructively; - this method presents broadband measurements by using higher-order modes by one resonator; - this method is applicable for the measurements on the following condition: - frequency: 10 GHz <= f <= 110 GHz; - relative permittivity: 1 <= er´ <= 10; - loss tangent: 10-4 <= tan d <= 10-2

These corrections apply to this standard:

ČSN EN IEC 63185:2021/Oprava1 (353012) Correction

Metoda vyváženého kruhového rezonátoru k měření komplexní permitivity nízkoztrátových dielektrických substrátů (Norma k přímému použití jako ČSN).

Correction published on 1.1.2023

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