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ČSN EN IEC 63202-1 (364662)
Photovoltaic cells - Part 1: Measurement of light-induced degradation of crystalline silicon photovoltaic cells
Translate name
STANDARD published on 1.3.2020
The information about the standard:
Designation standards: ČSN EN IEC 63202-1
Classification mark: 364662
Catalog number: 509003
Publication date standards: 1.3.2020
SKU: NS-984774
The number of pages: 20
Approximate weight : 60 g (0.13 lbs)
Country: Czech technical standard
Category: Technical standards ČSN
The category - similar standards:
Annotation of standard text ČSN EN IEC 63202-1 (364662):
This part of IEC 63202 describes procedures for measuring the light-induced degradation (LID) of crystalline silicon photovoltaic (PV) cells in simulated sunlight. The magnitude of LID in a crystalline silicon PV cell is determined by comparing maximum output power at Standard Test Conditions (STC) before, and after, exposure to simulated sunlight at a specified temperature and irradiance. The purpose of this document is to provide standardized PV cell LID information to help PV module manufacturers in minimizing the mismatch between cells within the same module, thereby maximizing power yield
Preview of the standard ČSN EN IEC 63202-1 (364662)
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