ČSN EN IEC 63287-2 (358777)

Semiconductor devices - Guidelines for reliability qualification plans - Part 2: Concept of mission profile

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STANDARD published on 1.12.2023


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The information about the standard:

Designation standards: ČSN EN IEC 63287-2
Classification mark: 358777
Catalog number: 517541
Publication date standards: 1.12.2023
SKU: NS-1159526
The number of pages: 28
Approximate weight : 84 g (0.19 lbs)
Country: Czech technical standard
Category: Technical standards ČSN

The category - similar standards:

Semiconductor devices in general

Annotation of standard text ČSN EN IEC 63287-2 (358777):

Tato norma poskytuje směrnice pro sestavení kvalifikačních plánů spolehlivosti s využitím konceptu profilu nasazení na základě environmentálních podmínek a navrhovaného použití produktu. Tento dokument není určen pro vojenské a kosmické aplikace



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