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Testing of materials for semiconductor technology; determination of etch rates of etching mixtures; silicium-dioxid coating; optical method.
STANDARD published on 1.10.1990
Designation standards: DIN 50453-2:1990-10
Note: WITHDRAWN
Publication date standards: 1.10.1990
SKU: NS-203871
The number of pages: 2
Approximate weight : 6 g (0.01 lbs)
Country: German technical standard
Category: Technical standards DIN
Prüfung von Materialien für die Halbleitertechnologie; Bestimmung der Ätzrate von Ätzmischungen; Siliciumdioxid-Schichten; Optisches Verfahren.
Latest update: 2026-08-21 (Number of items: 2 298 377)
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