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VDE 0884-749-28. Semiconductor devices - Mechanical and climatic test methods - Part 28: Electrostatic discharge (ESD) sensitivity testing - Charged device model (CDM) - device level.
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STANDARD published on 1.2.2018
Designation standards: DIN EN 60749-28:2018-02
Note: WITHDRAWN
Publication date standards: 1.2.2018
SKU: NS-805642
The number of pages: 50
Approximate weight : 150 g (0.33 lbs)
Country: German technical standard
Category: Technical standards DIN
VDE 0884-749-28. Halbleiterbauelemente - Mechanische und klimatische Prüfverfahren - Teil 28: Prüfung der Empfindlichkeit gegen elektrostatische Entladungen (ESD) - Charged Device Model (CDM) - Device Level.
Latest update: 2026-10-21 (Number of items: 2 307 910)
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