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Standard DIN EN 60749-44:2017-04 1.4.2017 preview

DIN EN 60749-44:2017-04

Semiconductor devices - Mechanical and climatic test methods - Part 44: Neutron beam irradiated single event effect (SEE) test method for semiconductor devices.

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STANDARD published on 1.4.2017


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The information about the standard:

Designation standards: DIN EN 60749-44:2017-04
Publication date standards: 1.4.2017
SKU: NS-675738
The number of pages: 22
Approximate weight : 66 g (0.15 lbs)
Country: German technical standard
Category: Technical standards DIN

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The category - similar standards:

Semiconductor devices in general

Annotation of standard text DIN EN 60749-44:2017-04 :

Halbleiterbauelemente - Mechanische und klimatische Prüfverfahren - Teil 44: Prüfverfahren zur Einzelereignis-Effekt-Neutronenbestrahlung von Halbleiterbauelementen.

Latest update: 2026-08-31 (Number of items: 2 298 959)
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