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Semiconductor devices - Mechanical and climatic test methods - Part 5: Steady-state temperature humidity bias life test.
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STANDARD published on 1.1.2018
Designation standards: DIN EN 60749-5:2018-01
Note: WITHDRAWN
Publication date standards: 1.1.2018
SKU: NS-801233
The number of pages: 11
Approximate weight : 33 g (0.07 lbs)
Country: German technical standard
Category: Technical standards DIN
Halbleiterbauelemente - Mechanische und klimatische Prüfverfahren - Teil 5: Lebensdauerprüfung bei konstanter Temperatur und Feuchte unter elektrischer Beanspruchung.
Latest update: 2026-06-09 (Number of items: 2 281 484)
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