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Standard DIN EN 62417:2010-12 1.12.2010 preview

DIN EN 62417:2010-12

Semiconductor devices - Mobile ion tests for metal-oxide semiconductor field effect transistors (MOSFETs).



STANDARD published on 1.12.2010


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The information about the standard:

Designation standards: DIN EN 62417:2010-12
Publication date standards: 1.12.2010
SKU: NS-239835
The number of pages: 9
Approximate weight : 27 g (0.06 lbs)
Country: German technical standard
Category: Technical standards DIN

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The category - similar standards:

Integrated circuits. Microelectronics

Annotation of standard text DIN EN 62417:2010-12 :

Halbleiterbauelemente - Prüfverfahren auf mobile Ionen für Feldeffekttransistoren mit Metall-Oxid-Halbleiter (MOSFET).

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Latest update: 2025-12-21 (Number of items: 2 252 887)
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