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Standard DIN EN IEC 60749-41:2023-03 1.3.2023 preview

DIN EN IEC 60749-41:2023-03

Semiconductor devices - Mechanical and climatic test methods - Part 41: Standard reliability testing methods of non-volatile memory devices.

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STANDARD published on 1.3.2023


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The information about the standard:

Designation standards: DIN EN IEC 60749-41:2023-03
Publication date standards: 1.3.2023
SKU: NS-1102722
The number of pages: 26
Approximate weight : 78 g (0.17 lbs)
Country: German technical standard
Category: Technical standards DIN

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Semiconductor devices in general

Annotation of standard text DIN EN IEC 60749-41:2023-03 :

Halbleiterbauelemente - Mechanische und klimatische Prüfverfahren - Teil 41: Standardisierte Prüfverfahren für die Zuverlässigkeit von nichtflüchtigen Speicher-Bauelementen.

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