DIN IEC/TS 61967-3:2015-08

VDE V 0847-21-3. Integrated circuits - Measurement of electromagnetic emissions - Part 3: Measurement of radiated emissions - Surface scan method.

STANDARD published on 1.8.2015

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The information about the standard:

Designation standards: DIN IEC/TS 61967-3:2015-08
Publication date standards: 1.8.2015
SKU: NS-613513
The number of pages: 32
Approximate weight : 96 g (0.21 lbs)
Country: German technical standard
Category: Technical standards DIN

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Integrated circuits. Microelectronics

Annotation of standard text DIN IEC/TS 61967-3:2015-08 :

VDE V 0847-21-3. Integrierte Schaltungen - Messung von elektromagnetischen Aussendungen - Teil 3: Messung der abgestrahlten Aussendungen - Verfahren der Oberflächenabtastung.

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