Standard DIN IEC/TS 62132-9:2015-08 1.8.2015 preview

DIN IEC/TS 62132-9:2015-08

VDE V 0847-22-9. Integrated circuits - Measurement of electromagnetic immunity - Part 9: Measurement of radiated immunity - Surface scan method.



STANDARD published on 1.8.2015


Language
Format
Availabilityin 7 working days
Price79.70 USD excl. VAT
79.70 USD

The information about the standard:

Designation standards: DIN IEC/TS 62132-9:2015-08
Publication date standards: 1.8.2015
SKU: NS-613514
The number of pages: 26
Approximate weight : 78 g (0.17 lbs)
Country: German technical standard
Category: Technical standards DIN

The category - similar standards:

Integrated circuits. Microelectronics

Annotation of standard text DIN IEC/TS 62132-9:2015-08 :

VDE V 0847-22-9. Integrierte Schaltungen - Messung der elektromagnetischen Störfestigkeit - Teil 9: Messung der Störfestigkeit bei Einstrahlungen - Verfahren der Oberflächenabtastung.

We recommend:

Technical standards updating

Do you want to make sure you use only the valid technical standards?
We can offer you a solution which will provide you a monthly overview concerning the updating of standards which you use.

Would you like to know more? Look at this page.


This website uses cookie files. By browsing this website you expresses your consent with using cookies. More information / I understand