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Testing of ceramic and basic materials - Direct determination of mass fractions of impurities in powders and granules of silicon carbide by inductively coupled plasma optical emission spectrometry (ICP OES) with electrothermal vaporisation (ETV).
STANDARD published on 1.7.2014
Designation standards: E DIN EN 15991:2014-07
Note: WITHDRAWN
Publication date standards: 1.7.2014
SKU: NS-285040
The number of pages: 28
Approximate weight : 84 g (0.19 lbs)
Country: German technical standard (Draft)
Category: Technical standards DIN
Prüfung keramischer Roh- und Werkstoffe - Direkte Bestimmung der Massenanteile von Spurenverunreinigungen in pulver- und kornförmigem Siliciumcarbid mittels optischer Emissionsspektroskopie mit induktiv gekoppeltem Plasma (ICP OES) und elektrothermischer Verdampfung (ETV).
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