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WITHDRAWN E DIN EN 60749-29:2002-09 1.9.2002 preview

E DIN EN 60749-29:2002-09 (Draft)

Semiconductor devices - Mechanical and climatic test methods - Part 29: Latch-up test.



STANDARD published on 1.9.2002


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The information about the standard:

Designation standards: E DIN EN 60749-29:2002-09
Note: WITHDRAWN
Publication date standards: 1.9.2002
SKU: NS-291918
The number of pages: 33
Approximate weight : 99 g (0.22 lbs)
Country: German technical standard (Draft)
Category: Technical standards DIN

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Annotation of standard text E DIN EN 60749-29:2002-09 :

Halbleiterbauelemente - Mechanische und klimatische Prüfverfahren - Teil 29: Latch-up-Prüfung.

Latest update: 2026-04-22 (Number of items: 2 274 512)
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