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Semiconductor devices - Mechanical and climatic test methods - Part 6: Storage at high temperature.
Translate name
STANDARD published on 1.9.2016
Designation standards: E DIN EN 60749-6:2016-09
Note: WITHDRAWN
Publication date standards: 1.9.2016
SKU: NS-647250
The number of pages: 12
Approximate weight : 36 g (0.08 lbs)
Country: German technical standard (Draft)
Category: Technical standards DIN
Halbleiterbauelemente - Mechanische und klimatische Prüfverfahren - Teil 6: Lagerung bei hoher Temperatur.
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