We need your consent to use the individual data so that you can see information about your interests, among other things. Click "OK" to give your consent.
Semiconductor devices - Micro-electromechanical devices - Part 27: Bond strength test for glass frit bonded structures using micro-chevron-tests (MCT).
STANDARD published on 1.8.2015
Designation standards: E DIN EN 62047-27:2015-08
Note: WITHDRAWN
Publication date standards: 1.8.2015
SKU: NS-603241
The number of pages: 26
Approximate weight : 78 g (0.17 lbs)
Country: German technical standard (Draft)
Category: Technical standards DIN
Halbleiterbauelemente - Bauelemente der Mikrosystemtechnik - Teil 27: Prüfung der Bondfestigkeit von Glasfritt gebondeten Strukturen unter Verwendung des Mikro-Chevron-Tests (MCT).
Do you want to be sure about the validity of used regulations?
We offer you a solution so that you could use valid and updated legislative regulations.
Would you like to get more information? Look at this page.
Latest update: 2026-01-25 (Number of items: 2 257 482)
© Copyright 2026 NORMSERVIS s.r.o.