WITHDRAWN E DIN EN 62047-27:2015-08 1.8.2015 preview

E DIN EN 62047-27:2015-08 (Draft)

Semiconductor devices - Micro-electromechanical devices - Part 27: Bond strength test for glass frit bonded structures using micro-chevron-tests (MCT).



STANDARD published on 1.8.2015


Language
Format
Availabilityin 7 working days
Price103.70 USD excl. VAT
103.70 USD

The information about the standard:

Designation standards: E DIN EN 62047-27:2015-08
Note: WITHDRAWN
Publication date standards: 1.8.2015
SKU: NS-603241
The number of pages: 26
Approximate weight : 78 g (0.17 lbs)
Country: German technical standard (Draft)
Category: Technical standards DIN

Annotation of standard text E DIN EN 62047-27:2015-08 :

Halbleiterbauelemente - Bauelemente der Mikrosystemtechnik - Teil 27: Prüfung der Bondfestigkeit von Glasfritt gebondeten Strukturen unter Verwendung des Mikro-Chevron-Tests (MCT).



Cookies Cookies

We need your consent to use the individual data so that you can see information about your interests, among other things. Click "OK" to give your consent.

You can refuse consent here.

Here you can customize your cookie settings according to your preferences.

We need your consent to use the individual data so that you can see information about your interests, among other things.