WITHDRAWN E DIN EN 62047-29:2016-08 1.8.2016 preview

E DIN EN 62047-29:2016-08 (Draft)

Semiconductor devices - Micro-electromechanical devices - Part 29: Electromechanical relaxation test method for freestanding conductive thin-films under room temperature.

Translate name

STANDARD published on 1.8.2016


Language
Format
Availabilityin 7 working days
Price79.60 USD excl. VAT
79.60 USD

The information about the standard:

Designation standards: E DIN EN 62047-29:2016-08
Note: WITHDRAWN
Publication date standards: 1.8.2016
SKU: NS-643057
The number of pages: 19
Approximate weight : 57 g (0.13 lbs)
Country: German technical standard (Draft)
Category: Technical standards DIN

Annotation of standard text E DIN EN 62047-29:2016-08 :

Halbleiterbauelemente - Bauelemente der Mikrosystemtechnik - Teil 29: Elektromechanisches Relaxations-Prüfverfahren für freistehende elektrisch leitende Dünnschichten bei Raumtemperatur.

We recommend:

Technical standards updating

Do you want to make sure you use only the valid technical standards?
We can offer you a solution which will provide you a monthly overview concerning the updating of standards which you use.

Would you like to know more? Look at this page.




Cookies Cookies

We need your consent to use the individual data so that you can see information about your interests, among other things. Click "OK" to give your consent.

You can refuse consent here.

Here you can customize your cookie settings according to your preferences.

We need your consent to use the individual data so that you can see information about your interests, among other things.