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WITHDRAWN E DIN EN IEC 60749-10:2023-06 1.6.2023 preview

E DIN EN IEC 60749-10:2023-06 (Draft)

Semiconductor devices - Mechanical and climatic test methods - Part 10: Mechanical shock - Device and subassembly.

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STANDARD published on 1.6.2023


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The information about the standard:

Designation standards: E DIN EN IEC 60749-10:2023-06
Note: WITHDRAWN
Publication date standards: 1.6.2023
SKU: NS-1143831
The number of pages: 13
Approximate weight : 39 g (0.09 lbs)
Country: German technical standard (Draft)
Category: Technical standards DIN

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Annotation of standard text E DIN EN IEC 60749-10:2023-06 :

Halbleiterbauelemente - Mechanische und klimatische Prüfverfahren - Teil 10: Mechanischer Schock - Bauelemente und Unterbaugruppe.

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