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Semiconductor devices - Mechanical and climatic test methods - Part 22-2: Bond strength - Wire bond shear test methods.
Translate name
STANDARD published on 1.11.2026
Designation standards: E DIN EN IEC 60749-22-2:2026-11
Publication date standards: 1.11.2026
SKU: NS-1288189
The number of pages: 37
Approximate weight : 111 g (0.24 lbs)
Country: German technical standard (Draft)
Category: Technical standards DIN
Halbleiterbauelemente - Mechanische und klimatische Prüfverfahren - Teil 22: Kontaktfestigkeit - Drahtbond-Scherprüfverfahren.
Latest update: 2026-11-03 (Number of items: 2 209 039)
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