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WITHDRAWN E DIN EN IEC 60749-28:2024-05 1.5.2024 preview

E DIN EN IEC 60749-28:2024-05 (Draft)

VDE 0884-749-28. Semiconductor devices - Mechanical and climatic test methods - Part 28: Electrostatic discharge (ESD) sensitivity testing - Charged device model (CDM) - device level.

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STANDARD published on 1.5.2024


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The information about the standard:

Designation standards: E DIN EN IEC 60749-28:2024-05
Note: WITHDRAWN
Publication date standards: 1.5.2024
SKU: NS-1171448
The number of pages: 49
Approximate weight : 147 g (0.32 lbs)
Country: German technical standard (Draft)
Category: Technical standards DIN

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Annotation of standard text E DIN EN IEC 60749-28:2024-05 :

VDE 0884-749-28. Halbleiterbauelemente - Mechanische und klimatische Prüfverfahren - Teil 28: Prüfung der Empfindlichkeit gegen elektrostatische Entladungen (ESD) - Charged Device Model (CDM) - Device Level.

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