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WITHDRAWN E DIN EN IEC 60749-30:2019-09 1.9.2019 preview

E DIN EN IEC 60749-30:2019-09 (Draft)

Semiconductor devices - Mechanical and climatic test methods - Part 30: Preconditioning of non-hermetic surface mount devices prior to reliability testing.

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STANDARD published on 1.9.2019


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The information about the standard:

Designation standards: E DIN EN IEC 60749-30:2019-09
Note: WITHDRAWN
Publication date standards: 1.9.2019
SKU: NS-968453
The number of pages: 25
Approximate weight : 75 g (0.17 lbs)
Country: German technical standard (Draft)
Category: Technical standards DIN

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Annotation of standard text E DIN EN IEC 60749-30:2019-09 :

Halbleiterbauelemente - Mechanische und klimatische Prüfverfahren - Teil 30: Behandlung nicht hermetisch verkappter oberflächenmontierbarer Bauelemente vor Zuverlässigkeitsprüfungen.

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