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WITHDRAWN E DIN EN IEC 60749-34-1:2024-08 1.8.2024 preview

E DIN EN IEC 60749-34-1:2024-08 (Draft)

Semiconductor devices - Mechanical and climatic test methods - Part 34-1: Power cycling test for power semiconductor module.

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STANDARD published on 1.8.2024


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The information about the standard:

Designation standards: E DIN EN IEC 60749-34-1:2024-08
Note: WITHDRAWN
Publication date standards: 1.8.2024
SKU: NS-1188225
The number of pages: 37
Approximate weight : 111 g (0.24 lbs)
Country: German technical standard (Draft)
Category: Technical standards DIN

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Annotation of standard text E DIN EN IEC 60749-34-1:2024-08 :

Halbleiterbauelemente - Mechanische und klimatische Prüfverfahren - Teil 34-1: Leistungszyklusprüfung für Leistungshalbleitermodule.

Latest update: 2026-07-26 (Number of items: 2 290 396)
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