WITHDRAWN E DIN EN IEC 63287-2:2022-06 1.6.2022 preview

E DIN EN IEC 63287-2:2022-06 (Draft)

Semiconductor devices - Guidelines for reliability qualification plans - Part 2: Concept of mission profile.

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STANDARD published on 1.6.2022


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The information about the standard:

Designation standards: E DIN EN IEC 63287-2:2022-06
Note: WITHDRAWN
Publication date standards: 1.6.2022
SKU: NS-1054744
The number of pages: 29
Approximate weight : 87 g (0.19 lbs)
Country: German technical standard (Draft)
Category: Technical standards DIN

Annotation of standard text E DIN EN IEC 63287-2:2022-06 :

Halbleiterbauelemente - Richtlinien für Zuverlässigkeitsqualifizierungspläne - Teil 2: Konzept des Einsatzprofils.



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