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Measurement of quartz crystal unit parameters by zero phase technique in (a) < pi > -network; part 2: phase offset method for measurement of motional capacitance of quartz crystal units; identical with IEC 60444-2:1980.
Automatically translated name:
Measurement of quartz crystal unit parameters by zero phase technique in a PI-network; part 2: phase offset method for measurement of motional capacitance of quartz crystal units; identical with IEC 60444-2:1980.
STANDARD published on 1.11.1991
Designation standards: E DIN IEC 60444-2:1991-11
Note: WITHDRAWN
Publication date standards: 1.11.1991
SKU: NS-302812
The number of pages: 12
Approximate weight : 36 g (0.08 lbs)
Country: German technical standard (Draft)
Category: Technical standards DIN
Messung von Schwingquarz-Parametern nach der Null-Phasenmethode in einem < pi > -Netzwerk; Teil 2: Messung der dynamischen Kapazität von Schwingquarzen nach der Phasenoffsetmethode.
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