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WITHDRAWN E DIN IEC 60749-23:2002-10 1.10.2002 preview

E DIN IEC 60749-23:2002-10 (Draft)

Semiconductor devices - Mechanical and climatic test methods - Part 23: High temperature operating life.



STANDARD published on 1.10.2002


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The information about the standard:

Designation standards: E DIN IEC 60749-23:2002-10
Note: WITHDRAWN
Publication date standards: 1.10.2002
SKU: NS-303081
The number of pages: 10
Approximate weight : 30 g (0.07 lbs)
Country: German technical standard (Draft)
Category: Technical standards DIN

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Annotation of standard text E DIN IEC 60749-23:2002-10 :

Halbleiterbauelemente - Mechanische und klimatische Prüfverfahren - Teil 23: Lebensdauer bei hoher Temperatur.

Latest update: 2026-07-28 (Number of items: 2 290 396)
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