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WITHDRAWN E DIN IEC 60749-40:2009-06 1.6.2009 preview

E DIN IEC 60749-40:2009-06 (Draft)

Semiconductor devices - Mechanical and climatic test methods - Part 40: Board level drop test method using a strain gauge.



STANDARD published on 1.6.2009


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The information about the standard:

Designation standards: E DIN IEC 60749-40:2009-06
Note: WITHDRAWN
Publication date standards: 1.6.2009
SKU: NS-303092
The number of pages: 43
Approximate weight : 129 g (0.28 lbs)
Country: German technical standard (Draft)
Category: Technical standards DIN

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Annotation of standard text E DIN IEC 60749-40:2009-06 :

Halbleiterbauelemente - Mechanische und klimatische Prüfverfahren - Teil 40: Prüfverfahren Fall der Leiterplatte unter Verwendung von Dehnungsmessstreifen.

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