WITHDRAWN E DIN IEC 62047-12:2010-05 1.5.2010 preview

E DIN IEC 62047-12:2010-05 (Draft)

Semiconductor devices - Micro-electromechanical devices - Part 12: A method for fatigue testing thin film materials using the resonant vibration of a MEMS structure.



STANDARD published on 1.5.2010


Language
Format
Availabilityin 7 working days
Price129.10 USD excl. VAT
129.10 USD

The information about the standard:

Designation standards: E DIN IEC 62047-12:2010-05
Note: WITHDRAWN
Publication date standards: 1.5.2010
SKU: NS-303796
The number of pages: 46
Approximate weight : 138 g (0.30 lbs)
Country: German technical standard (Draft)
Category: Technical standards DIN

Annotation of standard text E DIN IEC 62047-12:2010-05 :

Halbleiterbauelemente - Bauelemente der Mikrosystemtechnik - Teil 12: Verfahren zur Prüfung der Ermüdungsfestigkeit von Dünnschichtwerkstoffen unter Verwendung der Resonanzschwingungen bei MEMS-Strukturen.

We recommend:

Updating of laws

Do you want to be sure about the validity of used regulations?
We offer you a solution so that you could use valid and updated legislative regulations.
Would you like to get more information? Look at this page.




Cookies Cookies

We need your consent to use the individual data so that you can see information about your interests, among other things. Click "OK" to give your consent.

You can refuse consent here.

Here you can customize your cookie settings according to your preferences.

We need your consent to use the individual data so that you can see information about your interests, among other things.