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Semiconductor devices - Micro-electromechanical devices - Part 12: A method for fatigue testing thin film materials using the resonant vibration of a MEMS structure.
STANDARD published on 1.5.2010
Designation standards: E DIN IEC 62047-12:2010-05
Note: WITHDRAWN
Publication date standards: 1.5.2010
SKU: NS-303796
The number of pages: 46
Approximate weight : 138 g (0.30 lbs)
Country: German technical standard (Draft)
Category: Technical standards DIN
Halbleiterbauelemente - Bauelemente der Mikrosystemtechnik - Teil 12: Verfahren zur Prüfung der Ermüdungsfestigkeit von Dünnschichtwerkstoffen unter Verwendung der Resonanzschwingungen bei MEMS-Strukturen.
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