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WITHDRAWN E DIN IEC/TS 62132-9:2012-11 1.11.2012 preview

E DIN IEC/TS 62132-9:2012-11 (Draft)

VDE V 0847-22-9. Integrated circuits - measurement of electromagnetic immunity - Part 9: Measurement of radiated immunity - Surface scan method.



STANDARD published on 1.11.2012


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The information about the standard:

Designation standards: E DIN IEC/TS 62132-9:2012-11
Note: WITHDRAWN
Publication date standards: 1.11.2012
SKU: NS-603672
The number of pages: 52
Approximate weight : 156 g (0.34 lbs)
Country: German technical standard (Draft)
Category: Technical standards DIN

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Annotation of standard text E DIN IEC/TS 62132-9:2012-11 :

VDE V 0847-22-9. Integrierte Schaltungen - Messung der elektromagnetischen Störfestigkeit - Teil 9: Messung der Störfestigkeit bei Einstrahlungen - Verfahren der Oberflächenabtastung.

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