Standard E ÖVE EN IEC 63470 1.9.2026 preview

E ÖVE EN IEC 63470 (Draft)

Guideline for gate oxide reliability and robustness evaluation procedures for silicon carbide power mosfets (Fast Track) (IEC 47/3023/CDV) (english version)

Translate name

STANDARD published on 1.9.2026


Language
Format
AvailabilityIN STOCK
Price32.90 USD excl. VAT
32.90 USD

The information about the standard:

Designation standards: E ÖVE EN IEC 63470
Publication date standards: 1.9.2026
SKU: NS-1283176
The number of pages: 30
Approximate weight : 90 g (0.20 lbs)
Country: Austrian technische Norm (Draft)
Category: Technical standards ÖNORM

The category - similar standards:

Electrical engineering in general

We recommend:

Technical standards updating

Do you want to make sure you use only the valid technical standards?
We can offer you a solution which will provide you a monthly overview concerning the updating of standards which you use.

Would you like to know more? Look at this page.




Cookies Cookies

We need your consent to use the individual data so that you can see information about your interests, among other things. Click "OK" to give your consent.

You can refuse consent here.

Here you can customize your cookie settings according to your preferences.

We need your consent to use the individual data so that you can see information about your interests, among other things.