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Guideline for gate oxide reliability and robustness evaluation procedures for silicon carbide power mosfets (Fast Track) (IEC 47/3023/CDV) (english version)
Translate name
STANDARD published on 1.9.2026
Designation standards: E ÖVE EN IEC 63470
Publication date standards: 1.9.2026
SKU: NS-1283176
The number of pages: 30
Approximate weight : 90 g (0.20 lbs)
Country: Austrian technische Norm (Draft)
Category: Technical standards ÖNORM
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