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  4. Standard "GB 3443-1982"
WITHDRAWN GB 3443-1982 1.1.1982 preview

GB 3443-1982

General principles of measuring methods of MOS random access memory for semiconductor integrated circuits

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STANDARD published on 1.1.1982


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The information about the standard:

Designation standards: GB 3443-1982
Note: WITHDRAWN
Publication date standards: 1.1.1982
SKU: NS-1234515
Country: Chinese technical standard
Category: Technical standards GB

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Latest update: 2026-08-03 (Number of items: 2 291 378)
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