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Test procedures for semiconductor charged particle detectors
Translate name
STANDARD published on 1.1.1985
Designation standards: GB 5201-1985
Note: WITHDRAWN
Publication date standards: 1.1.1985
SKU: NS-1235870
Country: Chinese technical standard
Category: Technical standards GB
Latest update: 2026-06-10 (Number of items: 2 281 585)
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