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  4. Standard "GB 6617-1986"
WITHDRAWN GB 6617-1986 1.1.1986 preview

GB 6617-1986

Standard method for measuring resistivity of silicon wafers using spreading resistance probe

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STANDARD published on 1.1.1986


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238.80 USD

The information about the standard:

Designation standards: GB 6617-1986
Note: WITHDRAWN
Publication date standards: 1.1.1986
SKU: NS-1236708
Country: Chinese technical standard
Category: Technical standards GB

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