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Standard GB/T 13388-2009 30.10.2009 preview

GB/T 13388-2009

Method for measuring crystallographic orientation of flats on single-crystal silicon slices and wafers by X-ray techniques

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STANDARD published on 30.10.2009


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310.80 USD

The information about the standard:

Designation standards: GB/T 13388-2009
Publication date standards: 30.10.2009
SKU: NS-863059
Country: Chinese technical standard
Category: Technical standards GB

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