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Test method for sheet resistance of silicon epitaxial, diffused and ion-implanted layers using a collinear four-probe array
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STANDARD published on 30.10.2009
Designation standards: GB/T 14141-2009
Publication date standards: 30.10.2009
SKU: NS-864356
Country: Chinese technical standard
Category: Technical standards GB
Latest update: 2026-10-09 (Number of items: 2 304 581)
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