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Silicon epitaxial layers-determination of carrier concentration-mercury probe voltages-capacitance method
Translate name
STANDARD published on 30.10.2009
Designation standards: GB/T 14146-2009
Note: WITHDRAWN
Publication date standards: 30.10.2009
SKU: NS-864363
Country: Chinese technical standard
Category: Technical standards GB
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Latest update: 2025-07-02 (Number of items: 2 207 218)
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