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  4. Standard "GB/T 14847-2025"
Standard GB/T 14847-2025 31.10.2025 preview

GB/T 14847-2025

Test method for thickness of lightly doped silicon epitaxial layers on heavily doped silicon substrates—Infrared reflectance method

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STANDARD published on 31.10.2025


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The information about the standard:

Designation standards: GB/T 14847-2025
Note: Execute Date: may 2026
Publication date standards: 31.10.2025
SKU: NS-1247397
Country: Chinese technical standard
Category: Technical standards GB

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Testing of metals

Latest update: 2025-12-16 (Number of items: 2 252 193)
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