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Test methods for minority carrier lifetime in bulk germanium and silicon by measurement of photoconductivity decay
Translate name
STANDARD published on 30.10.2009
Designation standards: GB/T 1553-2009
Note: WITHDRAWN
Publication date standards: 30.10.2009
SKU: NS-866904
Country: Chinese technical standard
Category: Technical standards GB
Latest update: 2026-01-11 (Number of items: 2 254 176)
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