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Guideline for programmed defect masks and benchmark procedures for sensitivity analysisof mask defect inspection systems
Translate name
STANDARD published on 13.9.1999
Designation standards: GB/T 17866-1999
Publication date standards: 13.9.1999
SKU: NS-870589
Country: Chinese technical standard
Category: Technical standards GB
Latest update: 2026-10-09 (Number of items: 2 304 581)
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