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Semiconductor devices--Integrated circuits--Part 11:Section 1:Internal visual examination for semiconductor integrated circuits(excluding hybrid circuits)
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STANDARD published on 24.11.2003
Designation standards: GB/T 19403.1-2003
Publication date standards: 24.11.2003
SKU: NS-873112
Country: Chinese technical standard
Category: Technical standards GB
Latest update: 2026-08-14 (Number of items: 2 293 479)
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