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  4. Standard "GB/T 24578-2015"
WITHDRAWN GB/T 24578-2015 10.12.2015 preview

GB/T 24578-2015

Test method for measuring surface metal contamination on silicon wafers by total reflection X-Ray fluorescence spectroscopy

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STANDARD published on 10.12.2015


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Price382.80 USD excl. VAT
382.80 USD

The information about the standard:

Designation standards: GB/T 24578-2015
Note: WITHDRAWN
Publication date standards: 10.12.2015
SKU: NS-647951
Country: Chinese technical standard
Category: Technical standards GB

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Latest update: 2025-05-12 (Number of items: 2 199 201)
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