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  4. Standard "GB/T 26067-2010"
Standard GB/T 26067-2010 10.1.2011 preview

GB/T 26067-2010

Standard test method for dimensions of notches on silicon wafers

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STANDARD published on 10.1.2011


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Price274.80 USD excl. VAT
274.80 USD

The information about the standard:

Designation standards: GB/T 26067-2010
Publication date standards: 10.1.2011
SKU: NS-881200
Country: Chinese technical standard
Category: Technical standards GB

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Semiconducting materials

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