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GB/T 30701-2014
Surface chemical analysisChemical methods for the collection of elements from the surface of silicon-wafer working reference materials and their determination by total-reflection X-ray fluorescence (TXRF) spectroscopy
Automatically translated name:
Surface chemical analysis´?hemical methods for the collection of elements from the surface of silicon-wafer working reference materials and their determination by total-reflection X-ray fluorescence (TXRF) spectroscopy
STANDARD published on 27.3.2014
The information about the standard:
Designation standards: GB/T 30701-2014
Publication date standards: 27.3.2014
SKU: NS-366429
Country: Chinese technical standard
Category: Technical standards GB
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