Standard GB/T 31854-2015 3.7.2015 preview

GB/T 31854-2015

Test method for measuring metallic impurities content in silicon materials used for photovoltaic applications by inductively coupled plasma mass spectrometry

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STANDARD published on 3.7.2015


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180.00 USD

The information about the standard:

Designation standards: GB/T 31854-2015
Publication date standards: 3.7.2015
SKU: NS-648601
Country: Chinese technical standard
Category: Technical standards GB

The category - similar standards:

Semiconducting materials



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