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Test method for surface roughness of GaN single crystal substrate by atomic force microscope
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STANDARD published on 10.12.2015
Designation standards: GB/T 32189-2015
Publication date standards: 10.12.2015
SKU: NS-648976
Country: Chinese technical standard
Category: Technical standards GB
Latest update: 2026-05-13 (Number of items: 2 276 848)
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