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Semiconductor integrated circuit—Measuring methods for double data rate 3 synchronous dynamic random access memory(DDR3 SDRAM)
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STANDARD published on 7.6.2018
Designation standards: GB/T 36474-2018
Publication date standards: 7.6.2018
SKU: NS-850197
Country: Chinese technical standard
Category: Technical standards GB
Latest update: 2026-10-05 (Number of items: 2 304 304)
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