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Test method for radius of curvature of crystal plane in GaN single crystal substrate wafers
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STANDARD published on 12.10.2022
Designation standards: GB/T 41751-2022
Publication date standards: 12.10.2022
SKU: NS-1173894
Country: Chinese technical standard
Category: Technical standards GB
Latest update: 2026-05-15 (Number of items: 2 278 685)
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